>>SPM-MZ
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Features
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Typical Applications
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Product Description |
The SPM-MZ is a precision aligned, highly stable single
axis micropositioner designed as a Z-axis approach for
scanning probe microscopes. The SPM-MZ employs
our proprietary intelligent motor control for low drift
performance and incorporates a built-in right angle
bracket to ensure high stability. The total travel range
of the SPM-MZ is 25mm with a minimum step size of
95nm. An optional high resolution linear encoder may
be ordered to continuously monitor positions down to
50nm. The USB digital interface provides direct PC
control of the micropositioner as well as access to the
linear encoder.
The SPM-MZ is compatible with standard optomechanical
components, including tables, and Mad City Labs
Nano-OP Series and Nano-OP-M Series nanopositioners. Combining the SPM-MZ
with the Nano-OP Series offers the user an integrated Z-axis
approach with both long range travel and closed loop
sub-nanometer precision making it ideal high resolution
probe microscopy.
The SPM-MZ is recommended as a high stability automated
Z-approach upgrade for our SPM-M kit. For
users requiring ±25mm motion, we recommend the
RM21-MZ. |
Technical Specifications |
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| Micropositioner | |
| Range of motion |
25 mm |
| Micoropositioning step size | 95 nm |
| Maximum speed | 2 mm/sec |
| Motion Profile | |
| Motion > 500 steps | Automatic accel/decel control |
| Motion ≤ 500 steps | Constant 1 step/ms |
| Linear encoder resolution (optional) | 50 nm |
| Body material | Aluminum |
| Controller | MicroDrive™ |
| Computer interface | Bidirectional USB |
AFM Verification of PicoQ® Sensor Technology PerformanceThe stability of the nanopositioner-ready SPM-MZ is critical to high resolution SPM experiments. The SPM-MZ was used as a Z axis coarse approach for the measurements below. Position noise of a nanopositioning system is the ultimate limit of the system's measurement resolution. Many applications involving sub-nanometer measurements, such as atomic force microscopy (AFM), would not be possible without low noise nanopositioning systems. Some companies claim to sell systems with sub-nanometer resolution, but they do not have data from external metrology tests to support their claims. All Mad City Labs nanopositioning products are rigorously tested before shipment. These tests involve a series of measurements designed to fully characterize the performance of the nanopositioning system with a realistic environment and testing conditions that match the application. Available metrology tools include NIST-traceable interferometers, high resolution AFM, and a high resolution position noise analyzer, designed specifically for nanopositioning characterization. The links below lead to in-depth descriptions of some of our AFM measurements.
Measurements taken with an AFM show that nanopositioners with PicoQ® sensor technology have sufficiently low position noise to accurately resolve single atomic layer size steps, 312 pm. AFM Demonstrations: Sub-Nanometer Motion 100 and 450 micron range nanopositioners with PicoQ sensor technology perform 860 picometer steps, 1 nanometer sine wave, and repeated 95 picometer steps, externally measured by AFM. AFM Demonstrations: Measuring Surface Roughness AFM is used to externally verify that the position noise of a nanopositioning system with PicoQ® sensor technology is less than the surface roughness of a Si (111) sample, 60 pm RMS. |
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