>>AFMView™2
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Features
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Typical Applications
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Product Description |
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AFMView™2 software is used with MADPLL or QS-PLL™ and Mad City Labs motion control products. Custom Atomic Force Microscopes (AFM), can be built useing our controlles designed for use with resonant probes, such as tuning forks, and Mad City Labs nanopositioners and micropositioners. Hardware and the digital PLL are controlled via the AFMView™2 software supplied with the QS-PLL™ controller or MadPLL. The QS-PLL™ controller allows users to customize a resonant probe AFM instrument with the unique feature of “Lift Mode” scans in addition to the usual scanning modes. This instrument is ideal for scanning probe microscopy where tip-surface interactions are modulated by a field, such as scanning NV magnetometry. AFMView™2 software is compatible with all Mad City Labs closed loop nanopositioners and stepper motor driven micropositioners. Up to 3 axes of piezo nanopositioning is supported and up to 4 axes of micropositioning, giving an unparalled ability to configure an instrument for your application. In addition, there is an option to add encoders to 3 axes of the micropositioning. Mad City Labs closed loop nanopositioners offer superb stability and precision via our proprietary PicoQ® sensors. Our nanopositioners have been deployed previously in resonant probe AFM instruments with atomic step resolution. As a result, many different instrument configurations can be formed to enable optical and sample access. AFMView™2 software, which is supplied with the controller, simplifies the control of your atomic force microscope. Among the software features are automated setup, configuration control, auto-Q calculation and automatic parasitic capacitance compensation (PCC) control. These included features are designed to simplify setup and accelerate the data acquisition process. |
Technical Specifications
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Motion Control |
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| Closed Loop Nanopositioners | 1-3 axis |
| Position DAC Control |
20 Bit |
| Position ADC's |
24 Bit |
| Number of Micropositioners | 1-4 axis |
| Microposition minimum step size | 95 nm |
| Encoders | 1-3 axis |
| Encoder Resolution | 50 nm |
| Phase Locked Loop Control | Digital |
I/O Connectors |
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| Nanopositioners | DB-37 |
| Micropositioners | DB-50 |
| Feedback Monitor | 1 x BNC |
| 16 bit DAC output | -10V to +10V |
| 16 bit ADC input | 0-10V (2 x BNC) |
| Sensor Amplifier | DB-9 |
| Pixel Clock | TTL) |
| Line Clock | TTL) |
| Frame Clock | TTL) |
| AUX Clock | TTL) |
PLL Features |
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| Feedback Modes | Amplitude/Frequency/Phase Shift |
| Automatic Range Selection | YES |
| Parasitic Capacitance Compensation (PCC) | YES |
| Automatic PCC | YES |
| Adjustable PI loop filter | YES |
| Digitally Set Parameters | YES |
| Error Signal Inversion Capability | YES |
| Automatic Loop Filter Setup | YES, after initialization |
| Frequency Range | 10 kHz - 100 kHz |
General |
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| AC Power | 90 - 260 (50/60 Hz) |
| Controller Dimensions | 16.75" x 14" x 3.5" (42.6 cm x 35.6 cm x 8.9 cm) |
| Breakout Box Dimensions | 8.375" x 8" x8.9" (21.3 cm x 20.3 cm x 8.9 cm) |
| PC Connection | USB 2.0 |
| Operating System | Windows 7/8/10/11 |
AFM Verification using the QS-PLL.
Image of SiC stepped surface taken with an AFM incorporating the QS-PLL and AFMView™2 software. The measurement was made using an etched W tip attached to a tuning fork . The AFM used a custom Nano-3D200 with 200 x 200 um scan range and 20 um of Z motion. The system was set up as a sample scanner with a tuning fork sensor mounted to a three axis micropositioner. The X and Y axis of the micropositioner was manual while the Z axis was motorized. |
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